EPM7096LC68-7

High Density, erasable CMOS EPLD

- High-performance, EEPROM-based programmable logic devices (PLDs) based on second-generation MAX® architecture
- 5.0-V in-system programmability (ISP) through the built-in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface available in MAX 7000S devices
– ISP circuitry compatible with IEEE Std. 1532
- Includes 5.0-V MAX 7000 devices and 5.0-V ISP-based MAX 7000S devices
- Built-in JTAG boundary-scan test (BST) circuitry in MAX 7000S devices with 128 or more macrocells
- 5-ns pin-to-pin logic delays with up to 175.4-MHz counter frequencies (including interconnect)
- PCI-compliant devices available

Datenblatt: EPM7096.pdf